![]() The time taken for one measurement depends of the basic settings such as scan range, scan speed and step size used for the measurements. ![]() However, one sample can be mounted in for the measurements at a time since we do not currently have the auto sample changer. Powder/granular samples, membranes or thin films coated on other substrates can be placed on the well. ![]() Precise lattice parameter determination and so on.Ĭurrently, the IC-FAS has set of glass sample holders with 0.2 mm depth as shown in following figure for loading the samples.The more common applications of X-ray diffraction includes but not limited to Traditional powder diffraction measurements of Bruker Ultima IV use the Bragg-Brentano focusing geometry to provide high-intensity, high-resolution measurements of well-powdered samples. Different types of samples for instance powder/granular samples, thin films and solid membranes can be probed from 2-theta as small as 2° to 90° without having any hazel. The Rigaku Ultima IV represents state-of-the-art multipurpose X-ray diffraction (XRD) system.
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